The test probes are the generic terms used to describe a component whose spring
loaded tips will provide a reliable electrical contact to a target distance.
The traditional use of spring contact test probes can make contact with printed
circuit boards or electrical components, in order to test the functionality and
measure the value of the components. They are mostly used in the vacuum test
fixtures associated with automatic test equipment and used in a functional test
station as part of a larger production line. Here, the test probe is comprised
with a metal tube, ready to assemble with a spring and contact plunger, it
supplied as a one-piece item.
The test probe is usually
referred as an excellent electrical conductor and is resistant to corrosion.
Here, the electrical cable is generally connected to a receptacle in which the
test probes insert into. The use of a receptacle in the spring contact test probes allows the test probe
to be removed for cleaning or replacement without having to disconnect the
electrical cable. The spring contact probes are used to make contact with the various
test points on printed circuit boards, components and wiring fields. When it
employed in special test modules, the spring test tubes can be used to test the
connection-cable systems and also used in control engineering
units or as a charging contact.
The contact test probes have the plunger tip styles that can be used to provide a variety of tip styles and different spring pressures. This ensures the spring contact test probes to contact with the test surface. The test probes can also be mounted with the receptacles, where the electrical connection of the probe is made and allows the test probes to easily remove for performing the repair or replacement.
No comments:
Post a Comment