What are the advantages of spring contact probes?

The spring contact probes are used to create an electrical connection between the object that to be tested and the testing system. These contact probes are primarily used for electrical testing of printed circuit boards, connectors, cables and various other electrical components and assemblies. The main advantages of the spring contact probes are:

spring contact probes

·          
     Constant contact resistance.

·         High pointing accuracy.

·         Longevity.

·         High currents and frequencies as possible.

·         Easy installation in the test adapter by using receptacles

·         Interchangeable.

Other categories are interface probes, probes with rolling ball, switch probes, high current probes, threaded probes; pneumatic probes etc. Flat tip pin size contact probe is suitable for solder pads and contact pins. Different uses of contact probes are according to the tip pin size. High current probes are used for high current application, specially designed for a very small probe resistance.

Probes are a durable component, which can perform several hundred thousand contact cycles with stable contact resistance. The variety of spring contact probe allows the user to find the perfect test needle for each application.  Each probe is used for different purposes. The users have to choose according to the tip style, length, spring force and travel time. Moreover, the spring contact probes are used to test the printed circuit boards, connectors, wire harness and other electronic components. They can be used in interfaces and easily removable electrical connections. The contact probes of springs do not require tolerance compensation because they are suitable for all contacting requirements in two-terminal measurement. Altogether, the contact probes of spring produce different materials such as brass, steel or copper beryllium. It contains a broad range of head shapes with a diameter between 0.5 and 3mm forms of your standard product range. You can find the spring contact probes from Equip-test.

Sockets Used in the Semiconductor Industry

Electrical gadgets have been a part of daily living for many decades now. Each task is made easier by these sets of equipment. Specifically, it lessens the time one needs to devote on a specific endeavor. One of the industrial products in this regard is the so-called electrical testing equipment. Custom made test sockets are used in the semiconductor industry. Sockets can be customized and developed according to the customer requirement. Test sockets are used in the semiconductor industry for testing integrated circuit. These are suitable for testing of devices ranging from QFN, BGA, PGA, TSOP etc. equip-test.com provides different test sockets.

The sockets are manufactured from the materials like Torlon, Ultem, Vespel, Peek, Ceramic  etc. These test sockets can be used for bench top testing or for machine automation test. The information required to quote test sockets are: POD (package outline drawing) of the device IC, If for a bench-top test: limitation for test socket size, if machine test: brand of machine handler, preferred test height. Custom made  test sockets are completely unique test socket solution offering maximum resilience in design and performance for complex units.  Various options available on custom test sockets like: “custom footprints and mounting options to interface with existing devices, double sided test, Open test socket bases for backside emission.

Burn-in Sockets:

Generally, as you know that burn-in Sockets are functioned as use and discard product, so diverse necessities are required. Many of these sockets are molded and in these cases, standard models are accessible.

Typical applications are such as EMMC, BGA, QFN, QFP, CSP, LCC, FPC, CPU, GPU, DVB, etc.

QA Technology Spring Loaded Test Probes and Sockets-

• Spring Loaded Test Probes provide a wide assortment of point styles to suit practically any test necessity.

• Plungers are made of beryllium copper or steel, and then warmly treated, plated gold over nickel.

• Patented test plan includes a calculated plunger tail for enhanced biasing that guarantees reliable contact with the test tube.

•Springs are built of high-quality music wire or stainless steel for long life

•"QA" remains for quality assurance in each test and attachment.

• Probe tubes are profound drawn from an assortment of compounds and highlight solidified valuable metal cladding for high performance

Sockets for the Semiconductor Industry

Hand crafted test Sockets are intended to be composed and manufactured by client prerequisites, for the most part utilized as a part of the semiconductor business. It can be utilized for Bench-top Testing or for machine automation test as well. Basically, the ability of these items ranges from 1.27 mm pitch size down to as small as 0.2 mm pitch. The most commonly utilized materials for assembling Test Sockets are Torlon, Ultem, Vespel, Peek, and Ceramic, etc. However, it can be possible to produce with all materials on client demand. It can be fabricated for gadgets ranging from QFN, BGA, PGA, and TSOP and so forth. 

Sockets

The test pin-tally per test sockets can extend from as low as 4 pin QFN gadgets up to as high as 3.500 pin BGA gadgets. The strength and the nature of these items meet the most astounding client prerequisites and requests. 

To figure out the test sockets such information is needed, as given below-

• POD (Package Outline Drawing) of the Device IC

• (L x W x H) limitation for test Plugs size is necessary for a Bench-Top Test.

• Brand of the Machine Handler, Preferred Test Height is required for a machine test.

• It can be even possible to make this product according to the customer requirement but for that, a probe pin drawing or a sample probe pin is required. 

Burn-in Sockets:

Generally, as you know that burn-in Sockets are functioned as use and discard product, so diverse necessities are required. Many of these sockets are molded and in these cases standard models are accessible.

Equip-Test

Typical applications are such as EMMC, BGA, QFN, QFP, CSP, LCC, FPC, CPU, GPU, DVB, etc. 

QA Technology Spring Loaded Test Probes and Sockets-

• Spring Loaded Test Probes provide a wide assortment of point styles to suit practically any test necessity.

• Plungers are made of beryllium copper or steel, and then warmly treated, plated gold over nickel.

• Patented test plan includes a calculated plunger tail for enhanced biasing that guarantees reliable contact with the test tube.

• Springs are built of high-quality music wire or stainless steel for long life 

• "QA" remains for quality assurance in each test and attachment.

• Probe tubes are profound drawn from an assortment of compounds and highlight solidified valuable metal cladding for high performance.