Showing posts with label Spring Loaded Contact Probes. Show all posts
Showing posts with label Spring Loaded Contact Probes. Show all posts

Wednesday, 21 September 2022

What’s Spring-Loaded Contact Probe and What are They For?

What is a Spring Loaded Contact Test Probe?

Spring-loaded contact test probes are also referred to as Pogopins, Contact pins, fixture pins, spring pins, test pins, and bed of nails.

To make contact with various test points on Printed Circuit Boards (PCBs), components, and wiring fields, spring contact test probes are used. The probes may test connector-cable systems when they are used in specialized test modules. The test probes can also be used as a charging contact or in control engineering units.

A tubular barrel, a spring, and a plunger are the components of a spring-loaded contact test probe. Different tip styles and spring tensions are available for plunger tip styles. The test surface is best-contact guaranteed.

Additionally, probes can be fixed inside housing units (receptacles) where an electrical connection is made. Also, makes it simple to remove the test probes for repair or replacement.

There are several applications for contact probes. Here’s a summary:

      ICT/FCT series - Probes for fixtures. Standard ATE probes for different centers

      Short Travel Probes/Battery contact series - Limited travel compact probes. Frequently used as a battery contact

      Interface Probes - Interface between the fixture and test system are usually realized by this option

      Pneumatic Probes - For the limited access, selective contacting of a single test point

     Threaded Probes (screw-in) - Threaded to provide a secure fit. Used to test wire harnessing in modules.

      High Current Probes - Used for applications requiring a high current.

      Switch Probes - Special probes with integrated switch elements are mainly used for presence tests.

      Push Back Probes - During the push back of connectors, the tight seat of the connector elements is verified.

Because of their numerous benefits, spring-loaded contacts have grown to be a favorite among engineers. And they could be benefiting you.

Advantages of Spring-Loaded Contact

  1. Solderless inter-connections
  2. Easy integration into systems
  3. Designed for durability
  4. Misalignment accommodation
  5. Consistent contacts
  6. High Vibration Tolerance
  7. Easy mating with other components
  8. Perfect for blind mating
  9. Self-cleaning components
  10. Excellent contact for cable termination
  11. Diversity of designs

Just Leave it to us, we have it covered!

Every design has unique specifications, and we are able to create the spring-loaded contacts you need to bring your idea to life.

We specialize in precision machined components, thus we are the experts in the industry when it comes to spring-loaded connections. We give you the products you want for your unique design needs.

Get your every component as per your need at https://equip-test.com/

https://equip-test-probes.blogspot.com/2022/08/equip-test-radio-frequency-testing.html
https://equip-test-probes.blogspot.com/2021/11/agilent-3070-in-circuit-test-ict-system.html

Monday, 8 March 2021

Everything that you should know about the In-Circuit Testing

 

The printed circuit are the ones that come with the complex assembly of numerous components and solder connections. Every component has to rightly function. Even the slightest glitch can make the device non-functional. Hence, testing each of such components is almost nearly impossible. But again, testing is the most important part of the process. Here is how the in-circuit testing comes to play. So, let us move ahead with the discussion of one of the most cost-effective testing process-

What are the common defects that can be found in in-circuit testing?

The common types of glitches that can be diagnosed in the in-circuit tests are- component marking, lead spacing, land sizes, component spacing, soldering, values of resistors, a mistake in the capacitance values, open circuits where there is a requirement of the flow of electricity, etc.

What are the elements of the in-circuit tester?

Various types of in-circuit tester available in the market have different components and procedures of testing. And employing the right tester is an important step for a manufacturing company to understand the glitches in a PCB and bring out glitch-free products to the market. But irrespective of the type of tester you choose, the following components can be easily found in the in-circuit testers- controller, software, fixture, interface, powered analog tests, analog scanner, etc.

Pros of in-circuit testing:



Some of the major advantages of using superlative quality in-circuit testing like Ingun testprobes are-

The in-circuit test probes are the easiest program that can be used to detect defects in the components.

  •    Quite fewer chances of operator errors are there
  •    Not a time taking the program to be conducted
  •    It is a reliable testing program and can cover manufacturing defects
  •   The results of the test are easy for interpretation
  •   No maintenance cost

Cons of in-circuit testing:



All the technologies will always have some drawbacks and the in-circuit testing is no different. Check out the pointers below to know all about the disadvantages of the PCB assembly.

  •           The test fixtures of in-circuit test probes can appear to be costly
  •           The in-circuit testing might fail to diagnose defaults like high density
  •           Inconsistent results can also be achieved in case if the test pins are not connected properly with the test pads.

Final Words:

The PCB testing helps in checking well with the quality of each component in an in-circuit board. Not only the user can complete the testing of every component in time but the type of performance of every component can also be noted. This is a solution that has been used by the market for years. It helps in dealing with the dynamic testing of the product. All the companies offering PCB or prototypes to the market require this tool for effective testing of the components in a very less time. 

Sunday, 28 October 2018

Workability of ICT Test Fixtures

 We are living in a technological world that is getting more and more complex by the day. New and newer forms of gadgets, tools and machines are being invented by numerous inventors and technocrats. These inventions are more complex than the previous one and also such machines and devices were possible due to inclusion of PCB or printed circuit board. Now the question is how these printed boards can be tested in the case of some sort of malfunction or while making them in a production line. Today, we will be having a detailed analysis about how these PCB boards are tested.   
ICT Test Fixtures
These ICT Test Fixtures are specially used for an In-circuit test that is an example of a white box testing, where an electrical test fixture tests a populated printed circuit board. These test fixtures are used for checking for shorts, opens, resistance, and capacitance as well as to check for other basic types of electrical failures and malfunctions that will show up whether the assembly is correctly made-up or not. All such types of tests will be performed with the help of bed of nails types of test fixture as well as with the assistance of other specialist electrical equipments. 

Thus, the ICT Test Fixtures are of many types. Bed of Nails tester is one of them. It is a classic electronic test fixture that has numerous pins inserted into a hole that aligned using tool pins to make contact with the test points on a printed circuit boards. These fixtures are also connected to a measuring unit by wires. Such a tester devices contain an array of small and tiny spring loaded pogo-pins. Each such pogo pin makes a contact with one node in the circuitry of the device under test. Hence by pressing this particular DUT against the bed of nails, trustworthy contact can be rapidly made with hundreds of IPTs also known as Individual Test Points within the perimeter of the DUT. Please visit site for more information.          

Wednesday, 26 September 2018

Complete Guide on High Current Test Probes


High current test probes designed for varied used in electronic industries for applications use high currents, such as testing, function test, signal transmission, and high power supply. A high current test probe allows ordinary appliances to size the voltages that would else be too high to measure or even critical. There are many test probes, the category os these probes are basically concentrated on the amount of voltage carried by a test probe. The high current test probe comes in multiple designs and head shapes, the ordinary is a fundamental probe for testing high currents. Typical and traditional probes are rated from 2to8 amps at current working level. Some higher current applications require vast power to run smoothly, these high current test probes are more solid and rugged and can withstand with high voltage capabilities of 10to150 amps and beyond. Here in this blog, we have listed some different current test probes that are available at http://www.equip-test.com/

http://www.equip-test.com/reliable-ict-test-probes/
high current test probes


Standard high current test probes - These test probes are available in varies designs and tip styles with different diameters. In addition, a choice of spring force at the collar of the tip for installation is available in varied applications.
Less Stroke Test Probe – These high current test probes are suitable for the applications that have limited space. In standard probes many attaching options are available. Hence, short stroke test probes limit its access.
High stroke Test Probe – best high current test probes for communicating applications which require a long stroke.
Robust Current Test Probes – are used in challenging environmental conditions, the probes are suitable as a permanently assembled contact elementary in appliances.
International Probes – high current test probes without a front tip. installation of such probes is been adjusted using the holder.  


Additional Features HIGH CURRENT TEST PROBES
All the high current test probes contain earthing to the circuit reference voltage. A short ponytail wire has connected the probe from head to ground. These probes allow a variety of tips to be installed. The tips which come with the small plastic insulating foot with hollows in the probes can make a fine pitch integrated circuits. 

To mount the high current test probes various options are available. These probes can either be pressed or screwed in the holder. Attaching without holder is also possible. Applications with shaking and vibrations use screw in probes.

Equip Test serves high-quality Current Test Probes while giving full support to customers with installation and services. For more information, please contact us at info@equip-test.com



Tuesday, 31 July 2018

What are the benefits of spring contact probes?


Spring Contact test probes are equipment which is used as test connector-cable systems. These equipments create an electrical connection between the object to be tested and the testing system. Primarily deployed for electrical testing of connectors, printed circuit boards, cables, and various other electrical components and assemblies these instruments prove instrumental in the connection between two electrical circuits or boards. 

These contact probes are made up of a tubular barrel, a spring and a plunger. There are many varieties of tip styles and different spring pressures that ensure the best contact with the test surface. 

http://equip-test.com/


    Small initial outlay
    Contact can be changed quickly
    Ideally suited for signal lines and currents
    Contact Spacing from 0.4 mm
    Low maintenance costs
    Available with floating mounting on request
    Extensive standard product range.

These probes are available for various applications:
Used as a threaded probe to provide a secure fit. Used for the test of wire harnessing.
Used for high current applications and designed for very small probe resistance.
These probes can be used as special probes with integrated switch elements, mainly used for presence.

Radiofrequency probes – Special spring contact probes are used to transmit high-frequency signals. 

Typical Tip Styles and Applications of Spring Contact Test Probes –
Conical Tip Style: Universal tip style with different angles for contacting solder pads and holes.
4-point Crown Tip Style: For pad surfaces and soldered pins.
Concave: You can use these concave styles in smooth contact of pins and wire wrap posts.
Step Probes Tip Style: For the position and presence tests of connectors. 

You can find these Spring Contact Test Probes from Equip-test.

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