Flying probes
are playing a big part in the electrical and electronic testing world. These
are mostly used for testing medium to low volume production, prototypes, and inboards with accessibility issues. The testing
related to flying probe implements
the usage of electro-mechanical controlled probes that are used for an easy
access to components on printed circuit assemblies. These are generally in
experiments and testing related to short circuits, open circuits, analog
signature analysis and analog components. The first generation of flying probes
provide single sided with the test probe on the top side only. Second
generation flying probe provides double-sided
with angled probes both on the ends. The third generation flying probes are
provided with four or more flying on the top and bottom side.
The few
applications of these types of probes are
·
4-
Wired Kelvin measurements and tests
·
PCBAs
for NPI, prototype and low volume testing
·
Low-value component testing
·
Backplane
testing
·
EOL
fixtures testing
·
Power
on and power off testing
·
Battery
testing
·
Copper
plating measurement
·
Open/short
detection
·
Reverse
engineering and more.
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