Spring contact probes and their utilizations

 

The Spring Contact Probe name comes from the device that connects the Device Under Test (DUT) with the electronics of the test machine, also called Contact Probe, Test Probe, Spring Probe, or Pogo Pin.

They are two different ways of utilization at Equip-Test, such as:

1.   Spring Contact Probes are prominent precision elements for the connection between the DUT and the test machine, in order to collect data during the in-circuit test (ICT). Spring Contact Probes are fundamental accuracy components for the connection between the DUT and the test machine, to gather information during the in-circuit test (ICT).

In this stage the primary need is to test a printed circuit board (PCB) by really taking a look at the changing boundaries of the parts of the electrical circuit, like the opposition/impedance, the presence of the actual part, and whether or not there are short circuits;

 

2.     Spring Contact Probes are additionally used to perform functional tests (FCT), during which the real operation of the DUT is confirmed under conditions practically equivalent to the real working conditions.

At this stage, one of the qualities that can be checked is the usefulness of the power supply line of the DUT itself.

To get the test probe process achievement, there are various types of Spring Contact Probes you can find at Equip-Test, which differ in the totality of installation, length, grid, network size, head shape, spring load, along with different types of connection.

Spring contact probes test is also referred to as:

·         Test Pins

·         Pogo Pins

·         Contact Pins

·         Fixture pins

·         Spring Pins

·         Bed of nails

All the above are utilized in generic terms to portray a component whose spring-stacked tip will give a reliable electrical contact to an objective whose distance away likely could be uncertain. The conventional use for them is to connect with printed circuit sheets (PCBs) or electrical parts, to test usefulness and to quantify the worth of the parts. They are generally utilized in vacuum test apparatuses related to program test hardware (ATE). They are likewise utilized inside a utilitarian test station as a feature of a bigger creation line.

The test is included a metal tube that assembled with a spring and contact unclogger, provided as a one-piece thing. They are generally gold plated as gold is an astounding electrical conduit and is resistant to corrosion. The electrical cable is generally associated with a receptacle into which the test probe is embedded. The utilization of a receptacle permits the test to be eliminated for cleaning or substitution without separating the electrical cable.

Spring Contact Probes at Equip-Test are utilized to connect to different test focuses on printed circuit sheets (PCBs), parts, and wiring fields. At the point when utilized in unique test modules, the tests can be utilized to test connector-cable systems. The test probes can likewise be utilized in charge designing units or as a charging contact.

Spring Contact Probes are comprised of a cylindrical barrel, a spring, and a plunger. Plunger tip styles can be given in an assortment of tip styles and distinctive spring pressures. This guarantees the best contact with the test surface.