Wednesday, 29 August 2018

What are the advantages of spring contact probes?


The spring contact probes are used to create an electrical connection between the object that to be tested and the testing system. These contact probes are primarily used for electrical testing of printed circuit boards, connectors, cables and various other electrical components and assemblies. The main advantages of the spring contact probes are:

·          
     Constant contact resistance.
·         High pointing accuracy.
·         Longevity.
·         High currents and frequencies as possible.
·         Easy installation in the test adapter by using receptacles
·         Interchangeable.

Other categories are interface probes, probes with rolling ball, switch probes, high current probes, threaded probes; pneumatic probes etc. Flat tip pin size contact probe is suitable for solder pads and contact pins. Different uses of contact probes are according to the tip pin size. High current probes are used for high current application, specially designed for a very small probe resistance.
Probes are a durable component, which can perform several hundred thousand contact cycles with stable contact resistance. The variety of spring contact probe allows the user to find the perfect test needle for each application.  Each probe is used for different purposes. The users have to choose according to the tip style, length, spring force and travel time. Moreover, the spring contact probes are used to test the printed circuit boards, connectors, wire harness and other electronic components. They can be used in interfaces and easily removable electrical connections. The contact probes of springs do not require tolerance compensation because they are suitable for all contacting requirements in two-terminal measurement. Altogether, the contact probes of spring produce different materials such as brass, steel or copper beryllium. It contains a broad range of head shapes with a diameter between 0.5 and 3mm forms of your standard product range. You can find the spring contact probes from Equip-test.

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