Tuesday 27 November 2018

Advantages of ingun test probes


Ingun test probes are gear which is utilized as test connector-link frameworks. These types of gear make an electrical association between the protest be tried and the testing framework. Essentially sent for electrical testing of connectors, printed circuit sheets, links, and different other electrical parts and gatherings these instruments demonstrate instrumental in the association between two electrical circuits or sheets. 

inguntest probes


These contact tests are comprised of a rounded barrel, a spring and a plunger. There are numerous assortments of tip styles and distinctive spring weights that guarantee the best contact with the test surface.

Advantages of ingun test probes

• Small starting expense
• Contact can be changed rapidly
• Ideally suited for flag lines and flows
• Contact Spacing from 0.4 mm
• Low upkeep costs
• Available with gliding mounting on demand
• Extensive standard item run.

These tests are accessible for different applications:
Utilized as a strung test to give a safe fit. Utilized for the trial of wire outfitting.
Utilized for high current applications and intended for little test opposition.
These tests can be utilized as uncommon tests with coordinated switch components, for the most part utilized for nearness.
Radiofrequency tests – Special spring contact tests are utilized to transmit high-recurrence signals.

Run of the mill Tip Styles and Applications of Spring Contact Test Probes –
Cone shaped Tip Style: Universal tip style with various plots for reaching bind cushions and gaps.
4-point Crown Tip Style: For cushion surfaces and bound pins.
Curved: You can utilize these inward styles in smooth contact of pins and wire wrap posts.
Step Probes Tip Style: For the position and nearness trial of connectors.
You can discover these ingun test probes from Equip-test.

Sunday 28 October 2018

Workability of ICT Test Fixtures

 We are living in a technological world that is getting more and more complex by the day. New and newer forms of gadgets, tools and machines are being invented by numerous inventors and technocrats. These inventions are more complex than the previous one and also such machines and devices were possible due to inclusion of PCB or printed circuit board. Now the question is how these printed boards can be tested in the case of some sort of malfunction or while making them in a production line. Today, we will be having a detailed analysis about how these PCB boards are tested.   
ICT Test Fixtures
These ICT Test Fixtures are specially used for an In-circuit test that is an example of a white box testing, where an electrical test fixture tests a populated printed circuit board. These test fixtures are used for checking for shorts, opens, resistance, and capacitance as well as to check for other basic types of electrical failures and malfunctions that will show up whether the assembly is correctly made-up or not. All such types of tests will be performed with the help of bed of nails types of test fixture as well as with the assistance of other specialist electrical equipments. 

Thus, the ICT Test Fixtures are of many types. Bed of Nails tester is one of them. It is a classic electronic test fixture that has numerous pins inserted into a hole that aligned using tool pins to make contact with the test points on a printed circuit boards. These fixtures are also connected to a measuring unit by wires. Such a tester devices contain an array of small and tiny spring loaded pogo-pins. Each such pogo pin makes a contact with one node in the circuitry of the device under test. Hence by pressing this particular DUT against the bed of nails, trustworthy contact can be rapidly made with hundreds of IPTs also known as Individual Test Points within the perimeter of the DUT. Please visit site for more information.          

Wednesday 26 September 2018

Complete Guide on High Current Test Probes


High current test probes designed for varied used in electronic industries for applications use high currents, such as testing, function test, signal transmission, and high power supply. A high current test probe allows ordinary appliances to size the voltages that would else be too high to measure or even critical. There are many test probes, the category os these probes are basically concentrated on the amount of voltage carried by a test probe. The high current test probe comes in multiple designs and head shapes, the ordinary is a fundamental probe for testing high currents. Typical and traditional probes are rated from 2to8 amps at current working level. Some higher current applications require vast power to run smoothly, these high current test probes are more solid and rugged and can withstand with high voltage capabilities of 10to150 amps and beyond. Here in this blog, we have listed some different current test probes that are available at http://www.equip-test.com/

http://www.equip-test.com/reliable-ict-test-probes/
high current test probes


Standard high current test probes - These test probes are available in varies designs and tip styles with different diameters. In addition, a choice of spring force at the collar of the tip for installation is available in varied applications.
Less Stroke Test Probe – These high current test probes are suitable for the applications that have limited space. In standard probes many attaching options are available. Hence, short stroke test probes limit its access.
High stroke Test Probe – best high current test probes for communicating applications which require a long stroke.
Robust Current Test Probes – are used in challenging environmental conditions, the probes are suitable as a permanently assembled contact elementary in appliances.
International Probes – high current test probes without a front tip. installation of such probes is been adjusted using the holder.  


Additional Features HIGH CURRENT TEST PROBES
All the high current test probes contain earthing to the circuit reference voltage. A short ponytail wire has connected the probe from head to ground. These probes allow a variety of tips to be installed. The tips which come with the small plastic insulating foot with hollows in the probes can make a fine pitch integrated circuits. 

To mount the high current test probes various options are available. These probes can either be pressed or screwed in the holder. Attaching without holder is also possible. Applications with shaking and vibrations use screw in probes.

Equip Test serves high-quality Current Test Probes while giving full support to customers with installation and services. For more information, please contact us at info@equip-test.com



Wednesday 29 August 2018

What are the advantages of spring contact probes?


The spring contact probes are used to create an electrical connection between the object that to be tested and the testing system. These contact probes are primarily used for electrical testing of printed circuit boards, connectors, cables and various other electrical components and assemblies. The main advantages of the spring contact probes are:

·          
     Constant contact resistance.
·         High pointing accuracy.
·         Longevity.
·         High currents and frequencies as possible.
·         Easy installation in the test adapter by using receptacles
·         Interchangeable.

Other categories are interface probes, probes with rolling ball, switch probes, high current probes, threaded probes; pneumatic probes etc. Flat tip pin size contact probe is suitable for solder pads and contact pins. Different uses of contact probes are according to the tip pin size. High current probes are used for high current application, specially designed for a very small probe resistance.
Probes are a durable component, which can perform several hundred thousand contact cycles with stable contact resistance. The variety of spring contact probe allows the user to find the perfect test needle for each application.  Each probe is used for different purposes. The users have to choose according to the tip style, length, spring force and travel time. Moreover, the spring contact probes are used to test the printed circuit boards, connectors, wire harness and other electronic components. They can be used in interfaces and easily removable electrical connections. The contact probes of springs do not require tolerance compensation because they are suitable for all contacting requirements in two-terminal measurement. Altogether, the contact probes of spring produce different materials such as brass, steel or copper beryllium. It contains a broad range of head shapes with a diameter between 0.5 and 3mm forms of your standard product range. You can find the spring contact probes from Equip-test.

Takaya Flying Probe Tester: For Electronic Testing

The takaya flying test series contains test systems to detect production defects on conventional printed circuit boards. This is done with ...