What are the key features of Spring Contact Test Probes?

Spring contact test probe are also referred to as Pogo Pins, Contact Pins, Bed of nails, Fixture pins, Spring Pins and Test Pins. These are made up of a tubular barrel, a spring and a plunger with gold plated as gold is an excellent electrical conductor and is resistant to corrosion. Contact is making through various test points on printed circuit boards (PCB’s), components and wiring fields through this spring contact test probe. The probes can be used to test connector-cable systems, when it employed in special test modules. Variety of tip style and different spring pressure are provided in the plunger tip style. Probes can be mounted into housing unit when an electric connection is made.

The spring loaded tip of the test probe will provide a reliable electrical contact to the target whose distance away may well be indeterminate. The main uses of these test probe are in vacuum test fixtures associated with automatic test equipment (ATE).They are also used inside a functional test station as part of a larger production line. The design of spring test probes is done in such a way that the use of the use of a receptacle allows the test probe to be removed for cleaning or replacement without having to disconnect the electrical cable. The electrical cable is connected to a receptacle which is the frame through this the test probe is inserted into.

How the quality Spring Contact Probes is important than the quantity?

Spring contact probes are used to test printed circuit boards, wire harnesses, connectors and other electronic components. Moreover, they can be used in interfaces and as easily removable electrical connections. Spring Contact Probes are used to make contact to various test points on printed circuit boards (PCB’s), components and wiring fields. When employed in special test modules, the probes can be used to test connector-cable systems. The probes can also be used in control engineering units or as a charging contact. These are made up of a tubular barrel, a spring and a plunger. Plunger tip styles can be provided in a variety of tip styles and different spring pressures. This ensures the best contact with the test surface. This also allows the probes to be easily removed for repair or replacement.

Contact Probes are available for various applications. Besides the technical applicability also machining and economical facts are relevant for this decision of using the contact probe. Short travels probes are solid probes with a limited travel facility .They are frequently used as battery or charge contact. Additionally, short travel probes can be integrated in end user products whenever low-wear electrical contacts are demanded. Other categories are Interface Probes, Probes with rolling ball, Switch Probes, High Current Probes, Threaded Probes; Pneumatic Probes etc. flat tip pin size contact probe is suitable for solder pads and contact pins. Different uses of contact probes are there according to the tip pin size. High current probes are used for high current application, specially designed for a very small probe resistance.

The main advantages of spring contact probe are longevity, Constant contact resistance, Interchangeable, Easy installation in the test adapter by using receptacles, High pointing accuracy, High currents and frequencies possible. Probes are a durable component, which can perform several hundred thousand contact cycles with stable contact resistance. The variety of spring contact probe allows the user to find the perfect test needle for each application.  Each probe is used for different purposes. The users have to choose according to the tip style, length, spring force and travel time. The wide range of applications for spring contact probes includes board tests with fine centers up to wire harness and connector test with individual and.

Spring Contact Test Probes – Provide Stable Contact Resistance

Through the mounting system, the spring contact probes are mostly and quickly used for exchanging without the wiring having to be replaced. The spring contact test probes are the durable components that can perform through several thousands of contact cycles with stable contact resistance. Here the longevity has led to the spring contact pins in the testing of circuit boards which are unrivaled. However, the spring contact probes are also often seems to be the spring loaded contact pins that are mainly used in the testing of printed circuit boards. The contact probes are built with electro mechanical connections between the test system and the contact probes are mounted in receptacles which are mounted in the test fixture.

Moreover, the contact test probes are suitable for contacting the requirements in two-terminal measurement which does not require tolerance compensation. Although, the spring contact test probes include a variety of spring contact probes that could be produced from materials such as hardened steel, brass and copper. A broad range of probes are come with a diameter of the different standard product range. In addition to this, the individual spring and testing contacts provide high vertical range of manufacturer that enables to produce and deliver spring contact probes in small quantities.

 

In addition to the standard spring contact test probes are different range of products that includes individual models for your specific testing task. The test probes are consist of a plunger, barrel and a fully encapsulated fine spring to provide the spring force required to maintain a positive contact.

Enjoy The Unique Measurement Capability Of Spring Contact Probes

The spring probes are mostly designed to optimize the performance of the high reliability and multicycle applications. The contact probes are compliant that makes the probes ideal for applications as they used for rotational and angular misalignment of the target. The spring contact probes are compressed with height and utilized on pitches as tight they are and they are also well suited for high density, battery contact, board-to-board and high frequency applications. The connectors of the contact probes are more compliant on the surface of their half rather than extending into the conventional pin and socket connectors. The spring test probes have a unique measurement capability.

The spring probes are designed to engage with its target and reach into a position to clear contaminants. Conversely, the connectors may be disengaged in many ways and making a probe technology to define the best approach to quick disconnect applications. Consequently, the spring contact probes permits a very high compliance to length ratio and allows the connectors to design as dense as and maintaining the compliances. The spring probes are in low profile designs which are creating a challenging conditions and vibration environment. As a single path, the spring probes combined with design and signal have their integrity and expertise that ensures the remarkable connector solutions for both the analog and digital applications.

The contact probes can be achieved with the spring probes interposes. Moreover, the spring probe contacts can also be made coaxial through the use of insulators and metal interposer bodies. The spring contact probes feature several innovations for control of performance and the advanced techniques provide excellent stability of contact resistance under the conditions of vibration. The probes can be designed to withstand of current contacts. The contact probes are capable of remarkable longevity based on design. The probes ate driven by the spring which maintain a contact force of contact over millions of cycles. The extensive materials combined with the expertise to deliver the contact that exceeds the highest customer specifications for insertion life.

The spring contact probes used for applications have the expertise and durable in nature that permit to design the connectors with excellent performance in harsh environments. Here, the contact probe requirements can be accommodated without sacrificing the performance.