Spring contact probes are used to test printed circuit boards, wire
harnesses, connectors and other electronic components. Moreover, they can be
used in interfaces and as easily removable electrical connections. Spring Contact Probes are used to make
contact to various test points on printed circuit boards (PCB’s), components
and wiring fields. When employed in special test modules, the probes can be
used to test connector-cable systems. The probes can also be used in control
engineering units or as a charging contact. These are made up of a tubular barrel, a spring and a plunger. Plunger
tip styles can be provided in a variety of tip styles and different spring
pressures. This ensures the best contact with the test surface. This also
allows the probes to be easily removed for repair or replacement.
Contact Probes are available for
various applications. Besides the technical applicability also machining and
economical facts are relevant for this decision of using the contact probe. Short
travels probes are solid probes with a limited travel facility .They are
frequently used as battery or charge contact. Additionally, short travel probes
can be integrated in end user products whenever low-wear electrical contacts
are demanded. Other categories are Interface Probes, Probes with rolling ball, Switch
Probes, High Current Probes, Threaded Probes; Pneumatic Probes etc. flat tip
pin size contact probe is suitable for solder pads and contact pins. Different
uses of contact probes are there according to the tip pin size. High current
probes are used for high current application, specially designed for a very
small probe resistance.
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