Spring Contact Test Probes are equipment which is used as test
connector-cable systems. These equipment create an electrical connection
between the object to be tested and the testing system. Primarily deployed for
electrical testing of connectors, printed circuit boards, cables, and various
other electrical components and assemblies these instruments prove instrumental
in the connection between two electrical circuits or boards.
These contact probes are
made up of a tubular barrel, a spring and a plunger. There are many varieties
of tip styles and different spring pressures that ensure the best contact with
the test surface. Spring contact probes are suitable for all contacting in two
terminal measurements which does not require tolerance compensation.
Benefits of Spring Contact Test Probes
• Small initial outlay
• Contact can be changed quickly
• Ideally suited for signal lines and
currents
• Contact Spacing from 0.4 mm
• Low maintenance costs
• Available with floating mounting on request
• Extensive standard product range.
These probes are available
for various applications:
Used as a threaded probe to
provide a secure fit. Used for the test of wire harnessing.
Used for high current
applications and designed for very small probe resistance.
These probes can be used as
special probes with integrated switch elements, mainly used for presence.
Radio frequency probes –
Special spring contact probes are used to transmit high-frequency signals.
These probes have an inner conductor for the transmission of the signal and an
outer conductor for shielding.
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