Characteristics and Uses of Ingun Test Probes

INGUN, A company based out of the UK is a front runner in the construction of Spring Loaded Test Probes. It is Europe’s premier manufacturer of spring loaded test probes and the UK Ltd. is its UK exclusive distributor.

equip-test.com provides ingun test probes for their own various industrial purposes. Ingun test probe range include : Fine Pitch, 25mil (0.64mm & above),Standard ICT / FCT, 100mil, 75mil, 50mil, 40mil, Long Stroke ICT / FCT 100mil, 75mil, 50mil,Lead Free High Energy Test Probes,Battery Contact / Short Stroke Test Probes Pneumatically Activated Test Probes, Switch Probes (acts as Normally Open Switch),Bead Probes (test point on net trace),High Current range, 10-400Amp,Screw-In Test Probes for automated applications,Rotating Test Probes for contaminated test applications,Flying Probe Test System Probes,Cable Harness Test Probes,RF Test Probes (Test Point/Connector),Dipole Test Probes (for Kelvin Measurement),Digital Signal Test Probes (Connector), Customised solutions, over 360 per annum by the Ingun R&D team etc.

  

In measurement and testing in production, Ingun test probes are used.  In high current ratings for small dimension and high temperature endurance these test probes are used. Diverse uses of ingun test probes are power supply inspection, mounted permanent contact element etc. In test field and in production,standardize interface solutions,machinery and plant engineering,as mounted contact elements these probes are used. All the probes are gold plated. 　INGUN test probes can be used in the temperature range of -40℃ to 80℃. INGUN also offers probes than can be used in an even wider temperature range of -100℃ to 200℃.

Sockets Used in the Semiconductor Industry

Electrical gadgets have been a part of daily living for many decades now. Each task is made easier by these sets of equipment. Specifically, it lessens the time one needs to devote on a specific endeavor. One of the industrial products in this regard is the so-called electrical testing equipment. Custom made test sockets are used in the semiconductor industry. Sockets can be customized and developed according to the customer requirement. Test sockets are used in the semiconductor industry for testing integrated circuit. These are suitable for testing of devices ranging from QFN, BGA, PGA, TSOP etc. equip-test.com provides different test sockets.

The sockets are manufactured from the materials like Torlon, Ultem, Vespel, Peek, Ceramic  etc. These test sockets can be used for bench top testing or for machine automation test. The information required to quote test sockets are: POD (package outline drawing) of the device IC, If for a bench-top test: limitation for test socket size, if machine test: brand of machine handler, preferred test height. Custom made  test sockets are completely unique test socket solution offering maximum resilience in design and performance for complex units.  Various options available on custom test sockets like: “custom footprints and mounting options to interface with existing devices, double sided test, Open test socket bases for backside emission.

Burn-in Sockets:

Generally, as you know that burn-in Sockets are functioned as use and discard product, so diverse necessities are required. Many of these sockets are molded and in these cases, standard models are accessible.

Typical applications are such as EMMC, BGA, QFN, QFP, CSP, LCC, FPC, CPU, GPU, DVB, etc.

QA Technology Spring Loaded Test Probes and Sockets-

• Spring Loaded Test Probes provide a wide assortment of point styles to suit practically any test necessity.

• Plungers are made of beryllium copper or steel, and then warmly treated, plated gold over nickel.

• Patented test plan includes a calculated plunger tail for enhanced biasing that guarantees reliable contact with the test tube.

•Springs are built of high-quality music wire or stainless steel for long life

•"QA" remains for quality assurance in each test and attachment.

• Probe tubes are profound drawn from an assortment of compounds and highlight solidified valuable metal cladding for high performance

What is EOL fixtures?

EOL fixtures are the end of line resistor that is in each pull station loop. It is used to put a load on the circuit so that each circuit draws a current.  Flying probe application includes EOL fixture testing. Functional test systems are the important part of the quality assurance of the electronic products. The functional test is often also combined with an in-circuit test. In the in-circuit test, PCBs with mounted components or electronic components are contacted and tested for faults in printed conductor routing, soldering and component faults. Flying probes are playing a big part in the electrical and electronic testing world. These flying probes are mostly used for testing medium to low volume production, prototypes, and in boards with accessibility issues. The testing related to flying probe implements the usage of electro-mechanical controlled probes that are used for an easy access to components on printed circuit assemblies (PCAs). These are generally in experiments and testing related to short circuits, open circuits, analog signature analysis and analog components.

Equip Test Company has main focus on testing loaded PCB boards. It supports EOL fixture solutions. Customized PCB Testing Solutions from Equip – Test cover from entry level projects until mechatronically very complex solutions from one hand with warranty and local support.

What is Flash fixtures and how it is useful?

Flash fixtures allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Flash runner cube and flash runner Quattro series are included in the flash fixtures. Flash runner cube is suitable for multi panel applications and direct parallel programming in modern production facilities. It is a high integration in system gang programmer specially designed for the programming multi-PCB panel assemblies. It is one of the fastest in-system programming systems. Here the projects and code images stored on memory cards with compact design for the production environment. It’s hardware features include 12 to 25V DC power supply input, Seven digital I/O lines, One programmable output power voltage, One programmable clock output, Secure Digital memory cards (up to 2 GB), On-board dynamic memory, On-board timekeeper and calendar, Opt isolated inputs for project selection, Optoisolated command inputs (START, START_ENA and STOP), Three opto isolated status outputs (FAIL, PASS, BUSY), Optoisolated RS-232/Ethernet channel.

Flash Runner Cube series is targeted at Manufacturing Mass Production and can work either in full standalone mode or controlled by host system, multiple programming up to 2 identical devices at a time. This in under the reliability features of the flash fixtures.

Flash runner Quattro is a high integration gang programmer based on the flash fixture technology.it is composed of a main board which hosts the programming and demulti plexing modules, plus various connectors used to interface to the target system and host/ATE. Its features include extremely fast programming with compact design for production environment.

What is Interconnect solution?

Technically, interconnect solutions are a major part that act as the connector interface between the test instruments and the devices/unit under test in the test applications. It can be utilized virtually in any testing requirement as it is accessible in various sizes according to the requirement. These frameworks are for the most part used as a piece of defense, aerospace, automotive, manufacturing, and such other applications as they are flexible, reconfigurable, and modular by design.

The i2 solution provides a signal, hybrid and configurable versions in a sleek 0.8” footprint. It has the capabilities to give the solution for the discrete-wiring, horizontal and right-angle PCB mounting. 

The features and benefit of i2 solution are

·         168 signal points with Quadra Paddle Technology

·         Hybrid option offers 120 signal points and 12 micro coax/micro power points

·         30° cable exit for vertical stack ability

·         0.8” footprint for horizontal stack ability

·         Integrated spring locking tabs

·         PCB compatible

·       Flying lead options allow you to pin your own configuration.

The i2's connecting with component coordinates spring locking tabs that affix over the hooking post for secure engagement. i2's 0.8" impression permits flat stack capacity. Keying pins and a square bolting component guarantee even and exact engagement. It has various positive qualities that sort out the issues that its 30º calculated link exit lessens the height requirement of the connector, permitting more space before the rack for instrumentation and when it comes to multi-connector board design, it reduces the vertical space between the connectors.

The i2 MX is the recently presented in i-Series and the i2 item group. This highly advanced product integrated with the advanced design highlights that make i-Series so well known. It gives a viewpoint on the necessities of Electromagnetic Interference protecting in the testing industry. The i2 MX likewise includes the modularity and adaptability of the icon, providing a more prominent assortment of I/O choices and designed for more than 10,000 cycles.

Increased Opportunities with the New i2 MX:

•             Compatible modular inserts

•             EMI-shielding accessible

•             Maximum cable bundles ability with advanced cable exit

•             i2 MX permits blending of signal, power, VTAC HSD and coax

•             Easy access for troubleshooting and repairs with detachable side panel on ITA back shell

Modular Inserts:

•  Substitutable modular inserts to appropriate for any condition

• Improved contact selection: Quadra Paddle, Tri-Paddle, Micro-Coax/Power, Mini Coax/Power,

  

VTAC

• 4 pre-configured solutions accessible

Accurate, Trustworthy Engagement:

• Spring-locking tabs attach over latching post for secure engagement

• Slimmer, metal engagement knob permits an expanded level stack capacity

• Reversible all metal back shells for various mounting choices

• Specifically planned Receiver strain help for dependable patch code arrangement and security

PCB Capabilities:

•Options include: horizontal mounting with utilization of stake pins, right angle mount with utilization of the header, and i2 to flex print

•84 Pin Header provides solder less compliant pins for easy usage

•Innovative header effectively adjusts i2 for a brisk end to connectors, for example, VHDCI and 68 Pin SCSI

Flying Leads:

• Flying Leads ITA Cable Assemblies to empower Pin Your Own Configuration adaptability

What are the key features of Spring Contact Test Probes?

Spring contact test probe are also referred to as Pogo Pins, Contact Pins, Bed of nails, Fixture pins, Spring Pins and Test Pins. These are made up of a tubular barrel, a spring and a plunger with gold plated as gold is an excellent electrical conductor and is resistant to corrosion. Contact is making through various test points on printed circuit boards (PCB’s), components and wiring fields through this spring contact test probe. The probes can be used to test connector-cable systems, when it employed in special test modules. Variety of tip style and different spring pressure are provided in the plunger tip style. Probes can be mounted into housing unit when an electric connection is made.

The spring loaded tip of the test probe will provide a reliable electrical contact to the target whose distance away may well be indeterminate. The main uses of these test probe are in vacuum test fixtures associated with automatic test equipment (ATE).They are also used inside a functional test station as part of a larger production line. The design of spring test probes is done in such a way that the use of the use of a receptacle allows the test probe to be removed for cleaning or replacement without having to disconnect the electrical cable. The electrical cable is connected to a receptacle which is the frame through this the test probe is inserted into.

How the quality Spring Contact Probes is important than the quantity?

Spring contact probes are used to test printed circuit boards, wire harnesses, connectors and other electronic components. Moreover, they can be used in interfaces and as easily removable electrical connections. Spring Contact Probes are used to make contact to various test points on printed circuit boards (PCB’s), components and wiring fields. When employed in special test modules, the probes can be used to test connector-cable systems. The probes can also be used in control engineering units or as a charging contact. These are made up of a tubular barrel, a spring and a plunger. Plunger tip styles can be provided in a variety of tip styles and different spring pressures. This ensures the best contact with the test surface. This also allows the probes to be easily removed for repair or replacement.

Contact Probes are available for various applications. Besides the technical applicability also machining and economical facts are relevant for this decision of using the contact probe. Short travels probes are solid probes with a limited travel facility .They are frequently used as battery or charge contact. Additionally, short travel probes can be integrated in end user products whenever low-wear electrical contacts are demanded. Other categories are Interface Probes, Probes with rolling ball, Switch Probes, High Current Probes, Threaded Probes; Pneumatic Probes etc. flat tip pin size contact probe is suitable for solder pads and contact pins. Different uses of contact probes are there according to the tip pin size. High current probes are used for high current application, specially designed for a very small probe resistance.

The main advantages of spring contact probe are longevity, Constant contact resistance, Interchangeable, Easy installation in the test adapter by using receptacles, High pointing accuracy, High currents and frequencies possible. Probes are a durable component, which can perform several hundred thousand contact cycles with stable contact resistance. The variety of spring contact probe allows the user to find the perfect test needle for each application.  Each probe is used for different purposes. The users have to choose according to the tip style, length, spring force and travel time. The wide range of applications for spring contact probes includes board tests with fine centers up to wire harness and connector test with individual and.

Spring Contact Test Probes – Provide Stable Contact Resistance

Through the mounting system, the spring contact probes are mostly and quickly used for exchanging without the wiring having to be replaced. The spring contact test probes are the durable components that can perform through several thousands of contact cycles with stable contact resistance. Here the longevity has led to the spring contact pins in the testing of circuit boards which are unrivaled. However, the spring contact probes are also often seems to be the spring loaded contact pins that are mainly used in the testing of printed circuit boards. The contact probes are built with electro mechanical connections between the test system and the contact probes are mounted in receptacles which are mounted in the test fixture.

Moreover, the contact test probes are suitable for contacting the requirements in two-terminal measurement which does not require tolerance compensation. Although, the spring contact test probes include a variety of spring contact probes that could be produced from materials such as hardened steel, brass and copper. A broad range of probes are come with a diameter of the different standard product range. In addition to this, the individual spring and testing contacts provide high vertical range of manufacturer that enables to produce and deliver spring contact probes in small quantities.

 

In addition to the standard spring contact test probes are different range of products that includes individual models for your specific testing task. The test probes are consist of a plunger, barrel and a fully encapsulated fine spring to provide the spring force required to maintain a positive contact.

Enjoy The Unique Measurement Capability Of Spring Contact Probes

The spring probes are mostly designed to optimize the performance of the high reliability and multicycle applications. The contact probes are compliant that makes the probes ideal for applications as they used for rotational and angular misalignment of the target. The spring contact probes are compressed with height and utilized on pitches as tight they are and they are also well suited for high density, battery contact, board-to-board and high frequency applications. The connectors of the contact probes are more compliant on the surface of their half rather than extending into the conventional pin and socket connectors. The spring test probes have a unique measurement capability.

The spring probes are designed to engage with its target and reach into a position to clear contaminants. Conversely, the connectors may be disengaged in many ways and making a probe technology to define the best approach to quick disconnect applications. Consequently, the spring contact probes permits a very high compliance to length ratio and allows the connectors to design as dense as and maintaining the compliances. The spring probes are in low profile designs which are creating a challenging conditions and vibration environment. As a single path, the spring probes combined with design and signal have their integrity and expertise that ensures the remarkable connector solutions for both the analog and digital applications.

The contact probes can be achieved with the spring probes interposes. Moreover, the spring probe contacts can also be made coaxial through the use of insulators and metal interposer bodies. The spring contact probes feature several innovations for control of performance and the advanced techniques provide excellent stability of contact resistance under the conditions of vibration. The probes can be designed to withstand of current contacts. The contact probes are capable of remarkable longevity based on design. The probes ate driven by the spring which maintain a contact force of contact over millions of cycles. The extensive materials combined with the expertise to deliver the contact that exceeds the highest customer specifications for insertion life.

The spring contact probes used for applications have the expertise and durable in nature that permit to design the connectors with excellent performance in harsh environments. Here, the contact probe requirements can be accommodated without sacrificing the performance.

What Are The Basic Requirements Of Spring Contact Test Probes?

The test probes are the generic terms used to describe a component whose spring loaded tips will provide a reliable electrical contact to a target distance. The traditional use of spring contact test probes can make contact with printed circuit boards or electrical components, in order to test the functionality and measure the value of the components. They are mostly used in the vacuum test fixtures associated with automatic test equipment and used in a functional test station as part of a larger production line. Here, the test probe is comprised with a metal tube, ready to assemble with a spring and contact plunger, it supplied as a one-piece item.

The test probes are usually referred as an excellent electrical conductor and is resistant to corrosion. Here, the electrical cable is generally connected to a receptacle in which the test probes insert into. The use of a receptacle in the spring contact test probes allows the test probe to be removed for cleaning or replacement without having to disconnect the electrical cable. The spring contact probes are used to make contact with the various test points on printed circuit boards, components and wiring fields. When it employed in special test modules, the spring test tubes can be used to test the connection-cable systems and also used in control engineering units or as a charging contact.

The contact test probes have the plunger tip styles that can be used to provide a variety of tip styles and different spring pressures. This ensures the spring contact test probes to contact with the test surface. The test probes can also be mounted with the receptacles, where the electrical connection of the probe is made and allows the test probes to easily remove for performing the repair or replacement. 

Different Standards And Special Models For Spring Contact Probes

The spring contact probes are used to create an electrical connection between the object that to be tested and the testing system. These contact probes are primarily used for electrical testing of printed circuit boards, connectors, cables and various other electrical components and assemblies. The main advantages of the spring contacts are:

·         Constant contact resistance.

·         High pointing accuracy.

·         Longevity.

·         High currents and frequencies as possible.

·         Easy installation in the test adapter by using receptacles

·         Interchangeable.

Moreover, the spring contact probes are used to test the printed circuit boards, connectors, wire harness and other electronic components. They can be used in interfaces and easily removable electrical connections. The contact probes of springs do not require tolerance compensation because they are suitable for all contacting requirements in two-terminal measurement. Altogether, the contact probes of spring produce different materials such as brass, steel or copper beryllium. It contains a broad range of head shapes with a diameter between 0.5 and 3mm forms of your standard product range.

In addition to this, the contact probes produce individual spring and testing probes with head shapes, that have diameters ranging from 0.25 to 10mm. The vertical range of manufacturer enables to deliver and produce the contact probes of spring in small quantities and it can also add the standard contact probes from a different range of products to include individual models for the specific tasking tasks.

The spring contact probes which are often have spring loaded contact pins that are mainly used in the testing of printed circuit boards. The spring contacts built the electro-mechanical connection between the test system. The spring contacts are mounted in receptacles which are mounted in the test fixture. Through this mounting system, it can quickly exchange it without the wiring have to be replaced. Probes are a durable component, which can perform several thousands of contact cycles with a stable contact resistance. The longevity has led to the spring contact pins in the testing of printed circuit boards are unrivaled. 

ICT Test Fixtures Used For All Testing Brands

Moreover, the circuit testing is traditionally used on mature products, especially in subcontract manufacturing. The ICT test fixtures define as a bed-of-nails test fixture mostly used to access multiple test points on the PCB’s bottom side. With sufficient access points the ICT can use to transmit the test signal into and out of the PCBs at high speed for performing the evaluation of components and circuits.

The test fixtures can be used as a traditional electronic test fixture. It has numerous pins inserted into holes, which are aligned using tooling pins to make contact. With the test points in an ICT test fixtures work as a printed circuit board and also connect to a measuring unit with wires. These ICT testing devices contain an array of small and spring-loaded pogo pins making contact with one node in the circuitry of the device under test.

A reliable contact can be made quickly with hundreds and in some cases thousands of individual test points within the circuitry. Devices that have been tested on an ICT test fixture may show a small mark or a dimple which comes from the sharp tips of pogo pins used in the fixture. It takes a few weeks to create the ICT fixture and do its programming. The ICT test fixtures can either be vacuum or press-down. The vacuum fixtures give a better signal reading versus the press-down type. On the other hand, vacuum fixtures are expensive because of their high manufacturing complexity.

What are the Explicit, Modular and Scalable Test Fixtures?

The test fixture is a tool that can be used consistently for testing some item, device or piece of a software. The test fixture can be found when testing electronics, software and physical devices. Generally, the text fixtures can be set up in three ways: in-line setup, delegate setup and implicit setup. In in-line set up the developers creates the test fixture in the same method as the rest of the test. But in the simplest test fixture, it is easy to create but later on its lead to duplication if multiple tests need to use the same initial data. The delegate setup with the test fixtures is a standalone setup method that can be accessed by multiple test methods. But in other ways, in implicit set up methods the developers placed the test fixture in a setup method subsequently that is later on used to set up multiple test methods.

This is different from the delegate setup, in that the overall setup of multiple tests can perform in a single setup method where the test fixture gets created instead of each test method. It has their own setup of procedures and links for performing the external test fixture. The main advantages of test fixtures are, it allows for tests to be repeatable one that is always starting with the same set up every time. It also eases testing code design by allowing the developers to separate the methods into different functions and reuse each function for other tests. The test fixtures configured to a known state at the start point, instead of working with any other device, they left from a previous test run.

It is considered as a bad practice when the test fixtures are too general in implicit setup, or when the test method sets up a test fixture and does not use it during the test. A more subtle issue is if the test methods ignore certain fields within the test fixture. Another bad practice is in inline setup the test setup contains more steps than are needed for the test.

Battery Probes

                                                   Battery Probes

Why ICT Test Probes Are So Famous Among Technicians in The World?

There are many sophisticated electrical products that are made every day in the world and in order to test their functionality, durability and quality, various types of testing devices are also made. Test probes are also one of them and one of the most popular types of test equipment is in-circuit test probe that is also an example of white box testing.

ICT test probes are a type of electrical test probe that is used for testing a populated printed circuit board for checking all types of problems such as checking for short-circuit related issues, opens, resistance and the ability of a system to store an electric charge. The entire purpose is to check whether the assembly of the printed circuit board is correctly fabricated or not.

Thus, more simply, it only means that these ICT test probes are naturally used in ICT test fixtures. Furthermore, they also have a high hitting accuracy and long life expectancy and are only required for high quality testing results. To know more about these test probes, please visit the site of ‘Equip Test’ and collect all the data regarding these test probes and call their customer care for all the relevant and important information. 

Never Underestimate the Merits of ICT Test Probes

Before going into the area of test probes, just try to understand about the in-circuit test first. It is just a sample of white box testing, where an electrical probe is used to test a populated printed circuit probe that is used to check for shots, opens, skirmish, capacitance as well as other basic amounts that will show up whether the assembly is correctly fabricated or not. Such type of testing can be performed with the help of bed of nails type of test fitting and specialist test equipment with a fixtureless in-circuit test set-up.

      

Thus, these spring-loaded ICT test probes are typically used in ICT test fixtures. For starters, they have high hitting accuracy with a long life expectancy and are therefore are the best results for high quality test results.

Moreover, these ICT test probes are sometimes also known as bed of nails tester probes with an old-styled electronic that has numerous pins inserted into holes in an epoxy phenolic glass cloth plastic-coated sheet that are aligned using tooling pins to make contact with the test points of circuit board. They are also connected to measuring units by wires.  In order to learn more about the test probes, visiting this particular site will be a wise decision.      

Battery Test Probes and Its Uses in Our Daily Activities

Our modern society has given us numerous modern inventions and products, mostly electronical devices that have multifaceted set of electrical mechanism that runs the product. But there is a hidden question that nobody has cared or bothered to ask and that is how all these electronic products are tested and by using what type of techniques and equipments are used to ascertain that the electricity inside them is flowing correctly and the electronic products like TV, DVD, electronic music systems are running effectively or not. Today is the day to just know all that in this blog that will eventually open the eyes of some of the viewers, especially those with good and sound knowledge about electronics.

For our readers information, all such electronic devices, products and goods are well-tested by using electronic test probes. There are different types of test probes that are used to test different types of complicated electronic goods and their circuit devices. Battery probes or battery operated test probes are one of them. Some even call them as battery test probes or interface pins that are used to provide a new level of ease-of-use in battery testing.

For starters, it is an ideal test tool for maintenance, troubleshooting and performance testing of individual stationary batteries and battery banks that are used in the critical battery back-up applications. Furthermore, this intuitive user interface oriented test device with a compact design and rugged construction has ensured an optimum performance with positive test results and reliability.

Hence, it also covers a broad range of battery test functions that ranges from DC voltage and resistance tests to full condition testing using automated cord function testing using automated thread function testing and the test probe or Battery probes integrated infrared temperature measurement. It is also well-designed for measurements on stationary batteries of all types.

One of the key features of this battery test probes are as follows:-

1)      Battery Voltage

During the internal resistance test, battery test probes also measure the voltage of battery under test.

For more details, please visit the website to know about these probes, their uses, merits and prices. 

Incredible Facts & Features about FCT Test Fixtures

Electronic appliances like television and computer has integrated circuit boards and mother boards that are tested and screened, before installing them besides the television screen that is not visible to the viewer. These integrated circuit boards are tested using different types of test fixtures. Today, we are going to know about one of them.

That test fixture is called Fct Test Fixtures and it is one of the multiple options that are available to meet your test fixture needs for your particular project and these are derived or retrieved from the projects needs and settings. There are various features of this particular test fixture that helps in testing the intended projects through connectors to ensure a good external connection for probing it from both top and bottom to make sure the test coverage is at the level that you require. Besides that, fixture pans can be fully loaded with a peripheral circuitry as the part of the test. After that, programmers can be installed directly into the pan and are hard wired to the probes for included programming of the probes.

There are some other interesting features of these Fct TestFixtures that is known as dual well fixtures. This feature allows one board to be tested while a second board is being loaded or unloaded from the original fixture. This substitute feature as well as fixture save immense time and also increase the amount or savings on this project. It also reduces the overall cost of the project. Please visit site to know more and for clearing doubts, please contact our customer care cell.

Functions, Merits and Workability of ICT Test Fixtures

We are living in a technological world that is getting more and more complex by the day. New and newer forms of gadgets, tools and machines are being invented by numerous inventors and technocrats. These inventions are more complex than the previous one and also such machines and devices were possible due to inclusion of PCB or printed circuit board. Now the question is how these printed boards can be tested in the case of some sort of malfunction or while making them in a production line. Today, we will be having a detailed analysis about how these PCB boards are tested.   

These ICT Test Fixtures are specially used for an In-circuit test that is an example of a white box testing, where an electrical test fixture tests a populated printed circuit board. These test fixtures are used for checking for shorts, opens, resistance, and capacitance as well as to check for other basic types of electrical failures and malfunctions that will show up whether the assembly is correctly made-up or not. All such types of tests will be performed with the help of bed of nails types of test fixture as well as with the assistance of other specialist electrical equipments.

Thus, the ICT Test Fixtures are of many types. Bed of Nails tester is one of them. It is a classic electronic test fixture that has numerous pins inserted into a hole that aligned using tool pins to make contact with the test points on a printed circuit boards. These fixtures are also connected to a measuring unit by wires. Such a tester devices contain an array of small and tiny spring loaded pogo-pins. Each such pogo pin makes a contact with one node in the circuitry of the device under test. Hence by pressing this particular DUT against the bed of nails, trustworthy contact can be rapidly made with hundreds of IPTs also known as Individual Test Points within the perimeter of the DUT. 

Reliable & Innovative Spring Contact Test Probes

Technology is developing rapidly in the world. This rapid growth of technology is helping us to produce or invent numerous new electronic gadgets and equipments. All such electronic gadgets and devices are extremely sophisticated especially their inner circuit boards that have to be tested and certified for use before making them completely ready for shipping them to the market for sale.

Thus before learning about spring contact test probes and how they do work and what its benefits are. It is better to know something from the very beginning. Let’s start with the test probes. These probes provide a vital link to the transfer by measuring signals as true and truthful as possible. Therefore, these elements can be regarded as the heart of text fixtures and for this particular reason, it’s important for a company like ‘equip test’ to offer high performance test probes with full quality and value ensuring maximized return of investment for our customers. Thus test probes provided by a company like ‘Equip Test’ always provides the ‘Grade A’ possible solution that is available for contacting your demands.

Thus, as far as spring contact test probes are concerned, it is a component with a spring loaded tip that will provide a trustworthy and reliable electrical contact to a particular target whose distance away from the spring contact probe may well be unknown. Thus, the traditional use of these contact probes is to make contact with the printed circuit probes and other such delicate electrical components. These probes are used for testing the functionality of the device and measure the value of its components. For further information, these probes are extensively used in the vacuum test fixtures allied with automatic test equipment. Furthermore, they are used in a functional test station as a part of larger production line.

Practical Uses of Spring Contact Probes

There are various spare parts and test probes that are used for checking many vital mechanical and electrical parts and components that are necessary in order to ensure that they are working properly without any type of malfunction and problem. So, if anyone asks about the life cycle of these contact probes then it completely depends on the design of the probes and operating conditions in the field. Furthermore, high lateral forces, high current load as well as contamination may lead to a considerably reduced life time of the probes.

Thus, it is vital to perpetually controlling and reviewing the quality parameters as well as to analyze the lifetime performance of our products with the help of spring contact probes. In the advanced and classified labs of our company, we have various tests and measurement equipment’s as well as setups for quality control and determination of technical parameters during research and development. One imperative subject is the life cycle test that is conducted with seven self-directed and independent stress stages. These test conditions provide an internal standard reference that allows confident statements regarding the life cycles of our probes.

Now, let’s have a practical look about the benefits these spring contact probes provides while testing products and equipment’s that are as follows:-

1)      The first and foremost advantage of this contact probe is its pointing accuracy and radial tolerance.

2)       Second advantage is its small initial outlay as well as contacts that can be changed quickly.

3)      It is also ideally and perfectly suited for signal lines and currents.

4)      Regarding spring contact probes, Contact spacing is also involved from 0.4mm.

5)      It has very low maintenance costs.

6)      Spring probes are also available with floating and mounting on request.

7)      Using of these probes to test their mechanical tools, devices and products is a knowledgeable advice for every individual associated with technical and mechanical engineering and testing fields.

8)      These probes come in extensive standard product range.

9)      They are available in small quantities in standard as well as special models. 

For more information on these contact probes then please visit our site and gather more knowledge on it