Takaya Flying Probe Tester: For Electronic Testing

The takaya flying test series contains test systems to detect production defects on conventional printed circuit boards. This is done with probes moving sharply and separately from each other so that there is no need for a conventional bed nails adapter. Takaya formulated the theory of the flying probe tester in 1987, which combines advanced electrical test techniques and highly accurate mechanics. Since then, takaya has become the leader in flying probe technology. To respond quickly to customers' rapidly shifting technological requirements and wants in the many diverse areas of the electronics industry, research, and development capacities are focused on the quick launch of the latest developments on the market.

 

Decrease in test costs

 

For the in-circuit test of assembled printed circuit boards, fixtures are typically employed. Typically, it takes one to several weeks to produce these fittings. Heavy prices and extended manufacturing times both play a big part. Fixtures can quickly become a major source of expense for manufacturing, storing, and upkeep, especially in production with high type diversity.

 

Precise and tactful communication

 

Four or six flying probes can precisely locate and engage contact sites up to 60 m long. This minimizes the "design for test" effort and makes testing intricate smd boards possible even without test points. It is possible to softly and carefully place the probes on the contact surfaces using soft touch control of the z-axis without considerably slowing down the test speed.

 

Substantial tests

 

There are 4-quadrant power supplies, sine and rectangular wave generators, frequency counters, led sensors, and other high-precision measuring tools for analog and digital components available. These numerous test options enable quick and accurate measurement of a wide variety of components.

 

Software that is simple and user-friendly

 

Intelligent and customer-focused technologies provide intuitive system handling, from program development to fault investigation. Flexible auxiliary tools for programming support the automatic determination of reference values, guard points, and measurement circumstances. There are also several fault analysis and troubleshooting programs accessible for quick test program editing. Both cad data and the "teach-in" procedure can be used to construct test programs. For, there is a takaya merlin pro software, that supports more than 40 different cad systems.

 

The new generation of takaya flying test probe systems consists of the apt-1400f and the apt-9000 series test systems. The systems integrate decades of knowledge and expertise in measurement technology, probe actuation, and probe positioning fields. The apt-1400/9000 systems stand out for their exceptional test coverage and high positioning accuracy and test speed. Here, numerous visual tests supplement the vast electrical experiments conducted.

 

Includes Optical Testing

 

The sophisticated recognition technology in apt systems enables accurate and dependable automatic optical testing. The optical system expands test coverage for components that cannot be evaluated using an electrical test. This is done by identifying missing, offset, or polarity-reversed components. Additionally, the camera captures 1d and 2d barcodes, which are included in the test reports. Accurate measurement and assignment of results are always ensured.

 

External communication

 

The apt test systems series are equipped with interfaces for external measuring and testing systems. All external testing systems such as boundary scans, system programming, frequency measurements, and function tests are now easy to conduct because of the open platform.

 

Quality, reliability, and convenience

 

Measuring equipment is the most crucial component of the takaya flying tester. However, the system's mechanical design is very rigid. Make sure not to compromise here.

 

To conclude

 

An organization with preparation can walk farther by reducing lead time and getting accurate tests. Your designs are given to takaya flying test for testing. Sometimes you may have to provide us with updated files if the old ones do not work correctly. Moreover, it is impossible to know until you hand over your data. So, respond sooner. Make sure to provide your contact manufacturer of electrical schematics whenever possible. Or else it would not be easy to compare boards and tell what your parts are supposed to do. In several cases, we remove any mysterious element from the program instead of starting from the beginning.

A Comprehensive Guide to Kelvin Probe Technique by Equiptest.com

Kelvin probe techniques are used to measure the work functions of materials. They have been successfully applied in surface science for decades, usually under UHV conditions. It is employed to study the adsorption of molecule surfaces or reconstruction processes of single-crystal surfaces. Both of which cause a change in the surface or dipole potential.

What is the Kelvin probe technique?

The Kelvin Probe technique is a non-contact, non-destructive method that measures the change in the contact potential difference (CPD) between the sample and the electrode using a vibrating reference electrode.

 

The work function difference between the tip and sample is produced using the conventional Kelvin probe. Lord Kelvin, a renowned Scottish scientist, proposed the Kelvin method in 1861. Typically, the tip is calibrated against a reference surface, such as gold. However, KP Technology is the only company that offers absolute Kelvin probes. To generate absolute work function values, this combines the Einstein Photoelectric Effect with the Kelvin technique (in eV).

Specifications of Kelvin probe

Because the topmost 1 - 3 layers of atoms or molecules define the WF of a surface, the Kelvin probe is one of the most sensitive surface analysis techniques available. KP Technology systems have an extremely high wf resolution of 1 - 3 meV. This is currently the highest achieved by any commercial device. 

It does not make physical contact with the surface.  Instead, an electrical connection is made to another part of the sample or sample holder.

A head unit with a voice coil driving system and an inbuilt amplifier suspended above a sample is the physical form of a Kelvin Probe.

The sample and the vibrating tip combine to create a capacitor with a perfect, or parallel-plate shape. Electric charge is pushed around the external detecting circuit as the tip vibrates. Both the potential across the capacitor and the capacitor spacing can be determined to very high resolution. It can be done by carefully controlling the tip potential and automatically capturing and analyzing the resulting waveform.

Kelvin probes for Semiconductor surfaces

The Kelvin probe is the only method for accurately measuring the Fermi level on semiconductor surfaces, including organic (polymer) and inorganic (Si, Ge, CdS, etc.) semiconductor surfaces. White or monochromatic light illumination alters the Fermi level, causing energy band shifts that can be utilized to describe the interface and bulk defect states. These processes are known as Surface Photovoltage (SPV) and Surface Photovoltage Spectroscopy (SPS).  KP Technology can provide our systems with the necessary software and add-ons.

Equip-Test- Ultimate destination for all interface solutions

Equip-Test is a worldwide manufacturer of test probes and fixture kits for a variety of applications. Our primary product line consists of test probes, test fixture kits, customized ICT, functional test fixtures, and integrated ICT with function testing capabilities. We make significant investments in research and development, internal laboratories, and high-tech manufacturing plants. If you have any concerns, our knowledgeable staff will be happy to assist you. Visit our official website today if you are looking for interface solutions or probe test tools. You can also get a quote by calling +36-29/550-940.

A Comprehensive Guide to Machined Interconnect Solutions

As technology has become increasingly important in our modern world, the world has become driven by technology. With the increasing number of devices, the need for inter connectedness has grown incredibly. Machined interconnect solutions are key to seamless communication and data exchange between different computing devices. The quality of machined interconnect solutions is critical in determining overall system quality and reliability. There are various types of machine interconnect solutions, such as LANs, WANs, SANs, and cluster interconnects, each with its own set of features and characteristics. Machined interconnect solutions are used in a wide range of applications, including large-scale scientific research projects related to cloud computing and high-performance computing.

Machined Interconnect Solutions Explained

Machined Interconnect Solutions are a set of hardware and software technologies that allow machines to communicate with one another. Networking protocols, communication protocols, and hardware components are examples of this. These components work together to provide an efficient, dependable, and secure means for machines to communicate with one another. Networking is the most commonly used technology in machine interconnect solutions. Ethernet, Wi-Fi, and other networking protocols are examples of this. Designers have a wide range of options thanks to highly developed interconnect systems. It incorporates precision-machined design amalgamation to meet a variety of ductility, strength, and temperature resistance requirements. Engineers work on machine interconnect solutions for the unique requirements of each application optimization while conceptualizing precision parts. Different types of pylon blocks are used as hardware components. Spring probes include contacts, connectors, interposers, and other machined interconnect solutions.

Equip-Test for all interface solutions

Equip-Test is a global manufacturer of test probes and fixture kits that are used for various applications. Our main product line includes test probes, test fixture kits, customized ICT, functional test fixtures, and integrated ICT with function test capabilities. We highly invest in our research and development, internal laboratory, and high-tech production plants. In case any concerns, our well-trained staff will be there to help you. If you are looking for interface solutions or probe test tools, visit our official website today. You can also contact us at +36-29/550-940 to get a quote.